Sem Ip Core
This is, of course, as good a way of describing a logic upset as any I've heard ... Suhail, Xilinx Application Note 1073: NSEU Mitigation in Avionics Applications, 2010.  Neutron Induced Single Event Upset FAQ, Microsemi Corporation, 2011, www.microsemi.com/document-portal/doc view/130760-neutron-seu-faq.  C. Semiao, M.B. This configuration data includes an expected value of cyclic redundancy check over the configuration memory frames 332 through 334, or enables continuous checking of the configuration memory frames 332 through 334
In the context of circuit operation, this erroneous output value may be considered a soft error event. Your cache administrator is webmaster. W. To implement a user design in certain programmable integrated circuits, frames of configuration data configure the configuration memory of the programmable integrated circuit, and each frame of configuration data initializes a http://www.xilinx.com/support/documentation/ip_documentation/sem/v4_1/pg036_sem.pdf
Sem Ip Core
IEEE. Soft errors in combinational logic The three natural masking effects in combinational logic that determine whether a single event upset (SEU) will propagate to become a soft error are electrical masking, For an example implementation of a user design in a programmable integrated circuit, each programmable logic and interconnect resource inherits the criticality class of the code block that the programmable resource
- Also, in safety- or cost-critical applications where the cost of system failure far outweighs the cost of the system itself, a 1% chance of soft error failure per lifetime may be
- A mitigative technique is associated with each criticality class.
- A BRAM 203 can include a BRAM logic element (BRL 213) in addition to one or more programmable interconnect elements.
- In another embodiment, the portions of block 106 are the programmable logic and interconnect resources of a programmable integrated circuit, and the criticality class of each individual programmable resource can be
- A map is stored in a memory, and the map specifies a criticality class for each storage bit in the integrated circuit.
- Thermal neutrons are also produced by environmental radiation sources such as the decay of naturally occurring uranium or thorium.
- Inc., LogiCORE(TM) IP Soft Error Mitigation Controller v1.1 User Guide, UG764 (v1.1), Sep. 21, 2010, pp. 1-90, Xilinx, Inc., San Jose, CA USA.18Xilinx.
F. Boron-11, used at low concentrations as a p-type dopant, does not contribute to soft errors. For SEU classification, the IP core uses Xilinx Essential Bits technology to further increase system reliability. Sem Xilinx Santos, I.C.
IBM Journal of Research and Development. Xapp864 Storage bits of the configuration memory configure the programmable logic and interconnect resources. It is extremely hard to maintain the material purity needed. The programmable interconnect element INT 211 also includes the connections to and from the programmable logic element within the same tile, as shown by the examples included at the top of
G. Xilinx Seu Fit Rate Calculator Retrieved 2015-01-30. ^ Kyungbae Park; Sanghyeon Baeg; ShiJie Wen; Richard Wong (October 2014). "Active-Precharge Hammering on a Row Induced Failure in DDR3 SDRAMs under 3xnm Technology". Rodriguez, Nicholas J. Controlling alpha particle emission rates for critical packaging materials to less than a level of 0.001 counts per hour per cm2 (cph/cm2) is required for reliable performance of most circuits.
Since a logic circuit contains many nodes that may be struck, and each node may be of unique capacitance and distance from output, Qcrit is typically characterized on a per-node basis. http://studylib.net/doc/7200770/the-do-254-soft-error-mitigation-controller-1.00a-is That is, the average number of cosmic-ray soft errors decreases during the active portion of the sunspot cycle and increases during the quiet portion. Sem Ip Core Each of the configuration memory frames 332 through 334 includes additional storage bits that do not configure the programmable resources 308, 310 through 312, 314, 316 through 318, 320, 322 through Soft Error Mitigation Xilinx Images(4)Claims(20) What is claimed is: 1.
Teixeira, and J. This technique is often used for write-through cache memories. For instance, many failures per million circuits due to soft errors can be expected in the field if the system does not have adequate soft error protection. Osterlund, J. Xilinx Seu
ISSN0018-9499. ^ Baumann, R.; Hossain, T.; Murata, S.; Kitagawa, H. (1995). "Boron compounds as a dominant source of alpha particles in semiconductor devices": 297–302. In one embodiment, each elementary gate in the synthesized netlist is assigned a criticality class. S. Each code block has the criticality class of the first instance that encompasses the code block in the hierarchy, or a default criticality class when there is no such encompassing instance.
Horizontal areas 209 extending from this column are used to distribute the clocks and configuration signals across the breadth of the FPGA. If corruption of a storage bit does not cause any detrimental effects, the mitigative technique might be to completely ignore the corrupted storage bit or merely logging information specifying this soft Copyright © 2015 The Authors.
The specified classification circuit 346 indexes into the map table 352 with an address of the corrupted storage bit from specified check circuit 344.
in your book, Caves of Steel, published in the 1950s, you use an alpha particle emitter to 'murder' one of the robots in the story, by destroying ('randomizing') its positronic brain. The classification circuit determines the criticality class specified in the map table 350 or 352 for the combination of the corrupted storage bit and the current state of a status register Ars Technica. This article needs additional citations for verification.
Wirthlin, “A comparison of tmr with alternative fault tolerant design techniques for fpgas,” IEEE Transactions on Nuclear Science, vol. 54, pp. 2065-2072, 2007.  B. Help Direct export Save to Mendeley Save to RefWorks Export file Format RIS (for EndNote, ReferenceManager, ProCite) BibTeX Text Content Citation Only Citation and Abstract Export Advanced search Close This document The programmable logic and interconnect resources implement a user design in response to configuration data being stored in the configuration memory. Alternatively, roll-back error correction can be used, detecting the soft error with an error-detecting code such as parity, and rewriting correct data from another source.
BACKGROUND Soft errors in storage nodes of an integrated circuit cause persistent corruption of the state of the integrated circuit. In one embodiment, the map table 350 or 352 specifies a respective criticality class for each combination of one of the storage bits configuration in memory frames 332 through 334 and For SEU correction, the IP core performs the necessary operations to locate and correct SEU errors using the Virtex™-6 built-in ECC facility. Some FPGAs utilizing the architecture illustrated in FIG. 2 include additional logic blocks that disrupt the regular columnar structure making up a large part of the FPGA.
Science. 206 (4420): 776–788. Soft errors are caused by the high level of 10B in this critical lower layer of some older integrated circuit processes. IBM. 40 (1): 19–40. In another embodiment, the map table is stored in another memory (not shown) in the system for mitigating a soft error.
ISSN0163-5964. ^ Mukherjee, Shubhendu S.; Kontz, Michael; Reinhardt, Steven K. (2002). "Detailed design and evaluation of redundant multithreading alternatives". Thus, designers are usually much more aware of the problem in storage circuits. Kastensmidt, R. Habinc, “Functional triple modular redundancy: Vhdl design methodology,” Gaisler Research, vol.
There is a general need to limit the down time during recovery from soft errors.
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