Soft Error Combinational Logic
Boron-11, used at low concentrations as a p-type dopant, does not contribute to soft errors. ISSN1530-4388. ^ Franco, L., Gómez, F., Iglesias, A., Pardo, J., Pazos, A., Pena, J., Zapata, M., SEUs on commercial SRAM induced by low energy neutrons produced at a clinical linac facility, IEEE Transactions on Device and Materials Reliability. 5 (3): 449–451. ISSN0036-8075. have a peek at this web-site
Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General doi:10.1147/rd.401.0019. ^ a b Tom Simonite, Should every computer chip have a cosmic ray detector?, New Scientist, March 2008 ^ Gordon, M.S.; Goldhagen, P.; Rodbell, K.P.; Zabel, T.H.; Tang, H.H.K.; Clem, The computer tries to interpret the noise as a data bit, which can cause errors in addressing or processing program code. In a logic circuit, Qcrit is defined as the minimum amount of induced charge required at a circuit node to cause a voltage pulse to propagate from that node to the
The system returned: (22) Invalid argument The remote host or network may be down. The system returned: (22) Invalid argument The remote host or network may be down. A soft error is also a signal or datum which is wrong, but is not assumed to imply such a mistake or breakage. Generated Fri, 28 Oct 2016 09:07:37 GMT by s_fl369 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.8/ Connection
- In the context of circuit operation, this erroneous output value may be considered a soft error event.
- Typically, a semiconductor memory design might use forward error correction, incorporating redundant data into each word to create an error correcting code.
- our millions of dollars of research, culminating in several international awards for the most important scientific contribution in the field of reliability of semiconductor devices in 1978 and 1979, was predicted
- This nuclear reaction is an efficient producer of an alpha particle, 7Li nucleus and gamma ray.
- At the Earth's surface approximately 95% of the particles capable of causing soft errors are energetic neutrons with the remainder composed of protons and pions. IBM estimated in 1996 that one
- In this paper, we use table lookup MOSFET models to accurately capture the nonlinear properties of submicron MOS transistors.
- Retrieved 2015-03-10. ^ Dan Goodin (2015-03-10). "Cutting-edge hack gives super user status by exploiting DRAM weakness".
IEEE Transactions on Nuclear Science. 51 (6): 3427–3434. Benefits of Chipkill-Correct ECC for PC Server Main Memory - A 1997 discussion of SDRAM reliability - some interesting information on "soft errors" from cosmic rays, especially with respect to Error-correcting See also Electronics portal Single event upset Radiation hardening References ^ Artem Dinaburg (July 2011). "Bitsquatting - DNS Hijacking without Exploitation" (PDF). ^ Gold (1995): "This letter is to inform you Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search
In combinational logic, this effect is transient, perhaps lasting a fraction of a nanosecond, and this has led to the challenge of soft errors in combinational logic mostly going unnoticed. At low energies many neutron capture reactions become much more probable and result in fission of certain materials creating charged secondaries as fission byproducts. In critical designs, depleted boron—consisting almost entirely of boron-11—is used, to avoid this effect and therefore to reduce the soft error rate. Unfortunately, a higher Qcrit also means a slower logic gate and a higher power dissipation.
Neutrons are uncharged and cannot disturb a circuit on their own, but undergo neutron capture by the nucleus of an atom in a chip. Text is available under the Creative Commons Attribution-ShareAlike License; additional terms may apply. System-level soft errors occur when the data being processed is hit with a noise phenomenon, typically when the data is on a data bus. Your cache administrator is webmaster.
Either of the charged particles (alpha or 7Li) may cause a soft error if produced in very close proximity, approximately 5µm, to a critical circuit node. https://www.computer.org/csdl/trans/tq/2011/01/ttq2011010137.pdf In these early devices, chip packaging materials contained small amounts of radioactive contaminants. Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile For instance, many failures per million circuits due to soft errors can be expected in the field if the system does not have adequate soft error protection.
When the same test setup was moved to an underground vault, shielded by over 50 feet (15m) of rock that effectively eliminated all cosmic rays, zero soft errors were recorded. In Check This Out Some tests conclude that the isolation of DRAM memory cells can be circumvented by unintended side effects of specially crafted accesses to adjacent cells. Concludes that 1000–5000 FIT per Mbit (0.2–1 error per day per Gbyte) is a typical DRAM soft error rate. Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General
This counterintuitive result occurs for two reasons.
Retrieved 2015-03-10. ^ Reinhardt, Steven K.; Mukherjee, Shubhendu S. (2000). "Transient fault detection via simultaneous multithreading". However, from a microarchitectural-level standpoint, the affected result may not change the output of the currently-executing program. Integrated circuit manufacturers eliminated borated dielectrics by the time individual circuit components decreased in size to 150nm, largely due to this problem. Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search
A soft error will not damage a system's hardware; the only damage is to the data that is being processed. doi:10.1145/342001.339652.
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