Soft Error Detection In Microprocessors
Please help improve this article by adding citations to reliable sources. ACM SIGARCH Computer Architecture News. 30 (2): 99. An SEU is temporally masked if the erroneous pulse reaches an output latch, but it does not occur close enough to when the latch is actually triggered to hold. These neutrons are moderated as they are scattered from the equipment and walls in the treatment room resulting in a thermal neutron flux that is about 40×106 higher than the normal have a peek at this web-site
The name "compiler" is primarily used for programs that translate source code from a high-level programming language to a lower level language. doi:10.1109/RELPHY.1995.513695. ^ Wilkinson, J.D.; Bounds, C.; Brown, T.; Gerbi, B.J.; Peltier, J. (2005). "Cancer-radiotherapy equipment as a cause of soft errors in electronic equipment". These are typically installed into a computer case, or attached to it by a cable or through a port. Some tests conclude that the isolation of DRAM memory cells can be circumvented by unintended side effects of specially crafted accesses to adjacent cells. https://en.wikipedia.org/wiki/Soft_error
Soft Error Detection In Microprocessors
ece.cmu.edu. Since a logic circuit contains many nodes that may be struck, and each node may be of unique capacitance and distance from output, Qcrit is typically characterized on a per-node basis. ISSN0163-5964. This nuclear reaction is an efficient producer of an alpha particle, 7Li nucleus and gamma ray.
- After observing a soft error, there is no implication that the system is any less reliable than before.
- Tools and models that can predict which nodes are most vulnerable are the subject of past and current research in the area of soft errors.
- There are two types of soft errors, chip-level soft error and system-level soft error.
- Thus, designers are usually much more aware of the problem in storage circuits.
- Neutrons are produced during high energy cancer radiation therapy using photon beam energies above 10MeV.
SELSE Workshop Website - Website for the workshop on the System Effects of Logic Soft Errors Retrieved from "https://en.wikipedia.org/w/index.php?title=Soft_error&oldid=708568088" Categories: Computer memoryData qualityDigital electronicsHidden categories: Pages using citations with accessdate and While many electronic systems have an MTBF that exceeds the expected lifetime of the circuit, the SER may still be unacceptable to the manufacturer or customer. Usuki (all of Sony), and Y. Soft Error Vs Hard Error The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults.
External links Soft Errors in Electronic Memory - A White Paper - A good summary paper with many references - Tezzaron Jan 2004. Soft Error Correction Boron-11, used at low concentrations as a p-type dopant, does not contribute to soft errors. IEEE. Since a logic circuit contains many nodes that may be struck, and each node may be of unique capacitance and distance from output, Qcrit is typically characterized on a per-node basis.
Soft Error Correction
Thus, accessing data stored in DRAM causes memory cells to leak their charges and interact electrically, as a result of high cells density in modern memory, altering the content of nearby Usually, only one cell of a memory is affected, although high energy events can cause a multi-cell upset. Soft Error Detection In Microprocessors In the lower levels of the atmosphere, the flux increases by a factor of about 2.2 for every 1000m (1.3 for every 1000ft) increase in altitude above sea level. Xentry Hypervisor Level Soft Error Detection This process may result in the production of charged secondaries, such as alpha particles and oxygen nuclei, which can then cause soft errors.
James F. Check This Out The inclusion of boron lowers the melt temperature of the glass providing better reflow and planarization characteristics. It is typically expressed as either the number of failures-in-time (FIT) or mean time between failures (MTBF). However, in general, these sources represent a small contribution to the overall soft error rate when compared to radiation effects. Soft Error Rate
doi:10.1109/TDMR.2005.858342. Kobayashi, K. Indeed, in modern devices, cosmic rays may be the predominant cause. Source So, an error correcting code needs only to cope with a single bit in error in each correction word in order to cope with all likely soft errors.
For applications in medical electronic devices this soft error mechanism may be extremely important. Bit Flip Memory Error Typically, a semiconductor memory design might use forward error correction, incorporating redundant data into each word to create an error correcting code. Please try the request again.
IEEE Transactions on Nuclear Science. 51 (6): 3427–3434.
Detecting soft errors There has been work addressing soft errors in processor and memory resources using both hardware and software techniques. This reduces the range of particle energies to which the logic value of the node can be upset. One technique that can be used to reduce the soft error rate in digital circuits is called radiation hardening. Cosmic Ray Bit Flip Your cache administrator is webmaster.
Package radioactive decay usually causes a soft error by alpha particle emission. A. (1979). "Effect of Cosmic Rays on Computer Memories". Naturally occurring boron is 20% 10B with the remainder the 11B isotope. have a peek here Nagai, K.
IBM. 40 (1): 19–40. Soft error From Wikipedia, the free encyclopedia Jump to: navigation, search Not to be confused with software error. Mukherjee, S, "Architecture Design for Soft Errors," Elsevier, Inc., Feb. 2008. IEEE Transactions on Nuclear Science. 51 (6): 3427–3434.
Either of the charged particles (alpha or 7Li) may cause a soft error if produced in very close proximity, approximately 5µm, to a critical circuit node. In a logic circuit, Qcrit is defined as the minimum amount of induced charge required at a circuit node to cause a voltage pulse to propagate from that node to the
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