Soft Error Mitigation For Sram Based Fpgas
FanucciRead full-textFront-end ASICs for high-energy astrophysics in space Full-text · Conference Paper · Jul 2016 · Microprocessors and MicrosystemsO. PilatoR. morefromWikipedia Field-programmable gate array A field-programmable gate array (FPGA) is an integrated circuit designed to be configured by the customer or designer after manufacturing¿hence "field-programmable". Generated Fri, 28 Oct 2016 01:09:36 GMT by s_wx1196 (squid/3.5.20)
For example, a chip designed to run in a digital voice recorder is an ASIC. The interest for state-of-the-art FPGAs also stems from the fact that they are usually fabricated with a technology a few nodes ahead  when compared to ASICs and to rad-hard FPGAs. Generated Fri, 28 Oct 2016 01:09:36 GMT by s_wx1196 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.10/ Connection read this article Please try the request again.
The system returned: (22) Invalid argument The remote host or network may be down. Copyright © 2016 ACM, Inc. In this work, we observe that there are a lot of not-fully occupied look-up tables (LUTs) after logic synthesis. morefromWikipedia Application-specific integrated circuit An application-specific integrated circuit, or ASIC /¿e¿s¿k/, is an integrated circuit (IC) customized for a particular use, rather than intended for general-purpose use.
These radiation test experiments are supported by emulation using similar RO-based measurement techniques and Xilinx SEU Controller as a fault injector. The evaluation criterion of a design against soft errors is SER , which is computed as the probability of a fault occurs at it. ScienceDirect ® is a registered trademark of Elsevier B.V.RELX Group Recommended articles No articles found. Please try the request again.
GevinO. http://nzbsites.com/soft-error/soft-error-in-memory.html The proposed technique replaces not fully-occupied LUTs with corresponding functional equivalent classes, which can improve the reliability while preserve the functionality of the design. This technique is able to tolerate SEUs in both user and configuration bits of mapped designs.Do you want to read the rest of this conference paper?Request full-text CitationsCitations46ReferencesReferences35On extra delays affecting Your cache administrator is webmaster.
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- Results from these irradiation experiments show that RO period variations, up to 6.2 ns for Virtex-5 and 3.8 ns for Artix-7, could be induced.
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The error in device output or operation caused as a result of the strike is called an SEU or a soft error. Did you know your Organization can subscribe to the ACM Digital Library? Reliability is often measured as probability of failure, frequency of failures, or in terms of availability, a probability derived from reliability and maintainability. http://nzbsites.com/soft-error/soft-error-rate-mitigation-techniques-for-modern-microcircuits.html Full-text · Article · Sep 2014 Fatima Zahra TaziClaude ThibeaultYvon Savaria+1 more author ...Yves AudetRead full-textExploiting free LUT entries to mitigate soft errors in SRAM-based FPGAs"The first step of performing soft
On the other hand, error propagation probability of the fault at element í µí± (í µí°¸í µí± í µí± í µí± ) describes the criticality of the element, which is characterized or its licensors or contributors. SEUs can occur when a charged particle impacts the silicon substrate with enough energy to incur either a transient pulse in a combinational logic component or a state flip in a
Generated Fri, 28 Oct 2016 01:09:36 GMT by s_wx1196 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.7/ Connection Click the View full text link to bypass dynamically loaded article content. Experiments have shown a 27.48% decrease in repair time when PR is employed compared to the full bitstream configuration case. Hence, we propose a functional equivalent class based soft error mitigation scheme to exploit free LUT entries in the circuit.
Errors may be caused by a defect, usually understood either to be a mistake in design or construction, or a broken component. Reliability Engineering is a sub-discipline within Systems Engineering. The fault injection experiments allow a better understanding of the behaviour of IOBs affected by additional delays due to configuration bit flips, which in many cases is similar to what can The FPGA configuration is generally specified using a hardware description language (HDL), similar to that used for an application-specific integrated circuit (ASIC) (circuit diagrams were previously used to specify the configuration,
Moreover, PR is employed to keep the system on line while under repair and also to reduce repair time. See all ›46 CitationsSee all ›35 ReferencesShare Facebook Twitter Google+ LinkedIn Reddit Request full-text Soft error rate estimation and mitigation for SRAM-based FPGAsConference Paper · February 2005 with 25 ReadsDOI: 10.1145/1046192.1046212 · Source: DBLPConference: Proceedings morefromWikipedia Tools and Resources Buy this Article Recommend the ACM DLto your organization Request Permissions TOC Service: Email RSS Save to Binder Export Formats: BibTeX EndNote ACMRef Upcoming Conference: FPGA '17 Generated Fri, 28 Oct 2016 01:09:36 GMT by s_wx1196 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.6/ Connection
Experimental results show that this technique is orders of magnitude faster than fault injection method while is very accurate. Serventi+1 more author ...L.
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