Soft Error Rate Estimation
Proceedings of the International Symposium Quality Electronic Design (ISQED), pp. 755–76028.Rossi D, Cazeaux JM, Omana M, Metra C, Chatterjee A (2009) Accurate linear model for SET critical charge estimation. Microelectron Reliab 52:1215–1226CrossRefGoogle Scholar3.Blaauw D, Chopra K, Srivastava A, Scheffer L (2008) Statistical timing analysis: from basic principles to state of the art. Contact us for assistance or to report the issue. Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile http://www.sciencedirect.com/science/article/pii/S0026271410004804
Below are the most common reasons: You have cookies disabled in your browser. In this paper, we present a novel statistical Soft Error Rate estimation framework. However, those attempts are driven by complicated simulations and hardly deliver a sense of direction to the designers. On the other hand, the impacts of process variations on characteristics of the circuits in nano era make statistical approaches as an unavoidable option for soft error rate estimation procedure.
Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search Your cache administrator is webmaster. Please try the request again. The SER is calculated using a probabilistic formulation based on the parameters of SVWs.
Try a different browser if you suspect this. You must disable the application while logging in or check with your system administrator. Your cache administrator is webmaster. View full text Microelectronics ReliabilityVolume 51, Issue 2, February 2011, Pages 460–4672010 Reliability of Compound Semiconductors (ROCS) WorkshopEdited By Peter Ersland and Roberto MenozziPrognostics and Health ManagementEdited By Daniel
IEEE Trans Nucl Sci (TNS) 58(6):2719–25CrossRefGoogle Scholar16.Mahatme NN et al (2014) Impact of technology scaling on the combinational logic soft error rate. To achieve maximum efficiency in terms of power, performance, and reliability in dynamic scaling of voltage and frequency, it is critical to have a simple and accurate reliability model which estimates doi:10.1007/s10836-016-5583-3 82 Downloads AbstractNano-scale digital integrated circuits are getting increasingly vulnerable to soft errors due to aggressive technology scaling. IEEE Trans Nucl Sci (TN) 60(3):1767CrossRefGoogle Scholar10.Gill B, Seifert N, Zia V (2009) Comparison of alpha-particle and neutron-induced combinational and sequential logic error rates at the 32 nm technology node.
H.-P, Bhadra J (2009) On soft error rate analysis of scaled CMOS designs: a statistical perspective. http://nzbsites.com/soft-error/soft-error-rate-analysis-for-sequential-circuits.html Use your browser's Back button to return to the previous page. IEEE Transactions on Nuclear Science (TNS). 54(6)22.Papoulis A, Pillai SU (2002) Probability, random variables, and stochastic processes. Part of Springer Nature.
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Generated Fri, 28 Oct 2016 01:12:00 GMT by s_wx1194 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.9/ Connection Besides, power consumption and reliability significantly vary across workloads and among pieces of a single application which can be exploited to design adaptive runtime fault tolerant and low power systems. IEEE Trans Very Large Scale Integr Syst (TVLSI) 21(10):1837–1848CrossRefGoogle Scholar5.Cormen TH, Leiserson CL, Rivest RL, Stein C (2001) Introduction to algorithms.
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- Proceedings of the International Conference on Computer Design (ICCD), pp. 7–1319.Nadarajah S, Kotz S (2008) Exact distribution of the max/min of two gaussian random variables.
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- Proceedings of the International reliability physics symposium (IRPS) p. 5 F.2.1–5 F.2.617.Miskov-Zivanov N, Wu K-C, Marculescu D (2008) Process variability-aware transient fault modeling and analysis.
Salehia, , Fan Wangb, , Sied Mehdi Fakhraiea, a Nano Electronics Center of Excellence, School of Electrical and Computer Engineering, University of Tehran, North Kargar Ave., Tehran 14395-515, Iranb Juniper Networks, Proceedings of the International Conference Computer Aided Design (ICCAD), pp. 157–16325.Raji M, Pedram H, Ghavami B (2015) A practical metric for soft error vulnerability analysis of combinational circuits. IET Comput Digit Tech 9(6):311–320CrossRefGoogle Scholar27.Ramakrishnan K, Rajaraman R, Suresh S, Nijaykrishnan N, Xie Y, Irwin MJ (2006) Variation Impacts on SER of Combinational Circuits. To provide access without cookies would require the site to create a new session for every page you visit, which slows the system down to an unacceptable level.
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MetraReferences1.(2001) JEDEC standard: measurements and reporting of alpha particles and terrestrial comic ray-induced soft errors in semiconductor devices. Back to Top Skip to MainContent IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites cartProfile.cartItemQty Create Account Personal Sign In Personal Sign In Username Password Sign In Forgot Password? IEEE Des Test of Computers 30(2):77–8613.Kuo Y-H, Peng H-K, Wen C H-P (2010) Accurate Statistical Soft Error Rate (SSER) analysis using a quasi-monte carlo framework with quality cell models. Reason for failure: Query Not Valid Personal Sign In Create Account IEEE Account Change Username/Password Update Address Purchase Details Payment Options Order History View Purchased Documents Profile Information Communications Preferences
Why Does this Site Require Cookies? Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search Please note that Internet Explorer version 8.x will not be supported as of January 1, 2016. MIT Press & McGraw-Hill, 2nd edition6.Dixit A, Wood A (2011) The impact of new technology on soft error rates.
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