Soft Error Rate Mitigation Techniques For Modern Microcircuits
Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. He received his Ph.D. http://nzbsites.com/soft-error/soft-error-trends-and-mitigation-techniques-in-memory-devices.html
However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing He previously worked at the Institute of Electron Technology, Warsaw, Poland, and at MOSAID Technologies, Inc., Ottawa, Ontario, Canada (now Conversant Intellectual Property Management). We cannot find a page that matches your request.
Iniewski has published more than 100 research papers in international journals and conferences. Institutional Sign In By Topic Aerospace Bioengineering Communication, Networking & Broadcasting Components, Circuits, Devices & Systems Computing & Processing Engineered Materials, Dielectrics & Plasmas Engineering Profession Fields, Waves & Electromagnetics General He holds 18 international patents granted in USA, Canada, France, Germany, and Japan.
- Massengill latch leakage current NMOS non-critical paths normal crosstalk Nucl output p-n junction particle hit particle strike passive aggressor PMOS transistor radiation radiation harden reduce Sayil SECD SECN SET pulse shown
- Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesPage 109Page 82Page 110Page 64Page 103ContentsIntroduction 1 Circuit Soft Error Resilience Techniques 17
The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. She is currently a postdoctoral researcher in the Department of Information Engineering at the University of Padova. Alan MantoothCRC Press, Nov 26, 2012 - Technology & Engineering - 1041 pages 0 Reviewshttps://books.google.com/books/about/Extreme_Environment_Electronics.html?id=-gLSBQAAQBAJUnfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and Showcasing the latest advances in very-large-scale integrated (VLSI) circuits, VLSI: Circuits for Emerging Applications provides a balanced view of industrial and academic developments beyond silicon and complementary metal–oxide–semiconductor (CMOS) technology.
The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. latches and flip-flops, is challenging....https://books.google.com/books/about/Circuit_and_Layout_Techniques_for_Soft_e.html?id=WiaWZRuP6TkC&utm_source=gb-gplus-shareCircuit and Layout Techniques for Soft-error-resilient Digital CMOS CircuitsMy libraryHelpAdvanced Book SearchGet Textbooks on Google PlayRent and save from the world's largest eBookstore. D. https://books.google.com/books?id=F2KmCwAAQBAJ&pg=PA18&lpg=PA18&dq=soft+error+rate+mitigation+techniques+for+modern+microcircuits&source=bl&ots=11bK5D4e5U&sig=ie8wVHGeT994kgFum7PIxXjiSf4&hl=en&sa=X&ved=0ahUKEwiUwZKx3-fP Cressler is currently Ken Byers Professor of Electrical and Computer Engineering at Georgia Tech.
Her research concerns radiation and reliability effects on electronic devices, especially on nonvolatile semiconductor memories. They help us live longer and more comfortably, and do more, faster. Cressler,H. The book also offers valuable insight into modern radiation-hardening techniques.
Generated Fri, 28 Oct 2016 09:12:02 GMT by s_fl369 (squid/3.5.20) https://books.google.com/books?id=-gLSBQAAQBAJ&pg=PA173&lpg=PA173&dq=soft+error+rate+mitigation+techniques+for+modern+microcircuits&source=bl&ots=T8MC_u3_zk&sig=CUv1GS7V4Fdygl-T3q_CZ26MnjI&hl=en&sa=X&ved=0ahUKEwiUwZKx3- Simone has authored/coauthored more than 150 journal papers and conference presentations, three book chapters, and three radiation effects conference tutorials. Subscribe Enter Search Term First Name / Given Name Family Name / Last Name / Surname Publication Title Volume Issue Start Page Search Basic Search Author Search Publication Search Advanced Search The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues
We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. Use of this web site signifies your agreement to the terms and conditions. Use your browser's Back button to return to the previous page.
Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects
Please try the request again. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. From quantum-dot cellular automata (QCA) to chips for cochlear implants, this must-have resource: Investigates the trend of combining multiple cores in a single chip to boost performance of the overall system The system returned: (22) Invalid argument The remote host or network may be down.
Preview this book » What people are saying-Write a reviewWe haven't found any reviews in the usual places.Selected pagesTable of ContentsIndexContentsIntroduction to the Effects of Radiation on Electronic Devices1 Monte Carlo Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile His research concerns soft and hard errors induced by ionizing radiation in advanced CMOS technologies, and their interplay with device aging and ESD. have a peek here He holds an MSEE from Warsaw Technical University, Poland, as well as six patents, and has authored and coauthored several publications.Bibliographic informationTitleVLSI: Circuits for Emerging ApplicationsDevices, Circuits, and SystemsEditorTomasz WojcickiEditionillustratedPublisherCRC Press,
Features a chapter authored by renowned radiation authority Lawrence T. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and...https://books.google.com/books/about/Extreme_Environment_Electronics.html?id=-gLSBQAAQBAJ&utm_source=gb-gplus-shareExtreme Environment ElectronicsMy libraryHelpAdvanced Book SearchBuy eBook - $183.96Get this book in printCRC It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches. He is an associate editor for IEEE Transactions on Nuclear Science, a reviewer for several scientific journals, and a Radiation Effects Steering Group member-at-large.Bibliographic informationTitleIonizing Radiation Effects in Electronics: From Memories
degree in electronics (honors) from the Warsaw University of Technology (Warsaw, Poland) in 1988. Massengill latch layer layout logic MCU rate memory microprocessor mitigation MOSFETs N-well neutron NMOS node Nucl Nuclear Science operation optical fibers output oxide particle photodiode pipeline Proc protons radiation effects radiation It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. Inan, Ivan Linscott, Christoforos Kozyrakis, Stanford University.
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