Soft Error Tutorial
Subhasish Mitra. Pia Sanda. 60 mins: Circuit-level soft error protection techniques: Topics covered: classical hardening techniques such as selective node engineering, RC filtering, body biasing; Latch hardening techniques, selective gate sizing, and clock Tous droits rťservťs. Kyoungwoo Lee Dr. http://nzbsites.com/soft-error/soft-error-in-memory.html
- Watson Research Center, Yorktown Heights, NY.
- Mitra has published more than 90 technical papers in leading conferences and journals, and invented design and test techniques that have seen wide-spread proliferation in the industry.
- A consequence of rapid technology scaling is that transistors become more susceptible to soft errors, caused by charge-carrying energy particles; leading to system failures due to data corruption.
- His most recent honors include the IEEE Circuits and Systems Society Donald O.
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Please try the request again. silent errors. Speakers Prof. Generated Fri, 28 Oct 2016 06:15:10 GMT by s_sg2 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.10/ Connection
degree in physics from Cornell University, Ithaca, NY, in surface Raman scattering. Generated Fri, 28 Oct 2016 06:15:10 GMT by s_sg2 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.7/ Connection thesis focuses on radiation-induced defect formation and diffusion in wide band gap ionic crystals. news This part will be covered by Dr.
This tutorial will discuss the impact of technology scaling on soft error rates, circuit-level modeling of soft errors, architectural impact of soft errors, challenges associated with evaluation of run-time behaviors of Pia Sanda. [back to top] Presenters’ Biographies: Subhasish Mitra is an Assistant Professor in the Departments of Electrical Engineering and Computer Science of Stanford University. We elaborate on key works that had been instrumental in providing orthogonal dimensions of approaches to solving the problem of computation reliability. This part will be covered by Prof.
ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.6/ Connection to 0.0.0.6 failed. http://www.ewh.ieee.org/r6/scv/rl/articles/Soft%20Error%20mitigation.pdf His Ph.D. He is also deeply involved in developing methodologies for assessing the impact of NBTI on system performance. Generated Fri, 28 Oct 2016 06:15:10 GMT by s_sg2 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.9/ Connection
For a¬†researcher, the tutorial will be a¬†valuable one-stop-shop¬†to acquire knowledge of and analyze seminal research work in the field of soft error mitigation, at each of the design layers. Check This Out in physics from Vanderbilt University, Nashville, TN, and received his Ph.D. Please try the request again. The tutorial will cater to a wide audience comprising of both¬†(i)¬†researchers specializing in embedded and high performance computing, and¬†(ii)¬†system designers, architects, and programmers from the industry.
Power5 case study for on-line checking. Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile He has published more than 30 papers and holds several patents. Source Seifert has conducted research in a wide range of physics topics, from charge transfer processes in atomic collisions as a postdoctoral associate at North Carolina State University, to computational fluid dynamics
Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. Prof. The ACM Guide to Computing Literature All Tags Export Formats Save to Binder 13th IEEE International On-Line Testing Symposium Hersonissos-Heraklion, Crete, Greece July 8-11, 2007.
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Aviral Shrivastava Prof. Home Members Research Publications Resources Sponsors Soft Errors: The Hardware Software Interface Overview Continuous technology scaling provides us with the capability to fabricate complex functionality, into smaller processor chips, consuming low-power This part will be covered by Dr. Please try the request again.
At this juncture, we need to step back and reevaluate soft-error mitigation methodologies, at a system-level perspective. Over the years, researchers have developed several techniques at various layers of the design abstraction to protect the system from soft-errors.¬†With the advent of multi-core systems, designers need to reevaluate traditional Your cache administrator is webmaster. have a peek here Dr.
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